전자공학회논문지A (Journal of the Korean Institute of Telematics and Electronics A)
- 제32A권6호
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- Pages.67-74
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- 1995
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- 1016-135X(pISSN)
소자의 수명 예측을 위한 Weibull Step-Stress Type-I Model
Weibull Step-Stress Type-I Model Predict the Lifetime of Device
초록
This paper proposes the step-stress type-I censoring model for analyzing the data of accelerated life test and reducing the time of accelerated life test. In order to obtain the data of accelerated life test, the step-stress accelerated life test was run with voltage stress to CMOS Hex Buffer. The Weibull distribution, the Inverse-power-law model and Maximum likelihood method were used. The iterative procedure using modified-quasi-linearization method is applied to solve the nonlinear equation. The proposed Weibull step-stress type-I censoring model exactly estimases the life time of units, while reducting the time of accelerated life test and the equipments of test.
키워드