CVD and Sputtering-reflow Copper Metalization Technique with CMP

  • Hoshino, M. (Fujitsu Ltd., 1015 Kamikodanaka Nakahara-ku) ;
  • Furumura, Y. (Fujitsu Ltd., 1015 Kamikodanaka Nakahara-ku)
  • Published : 1995.02.01

Abstract

We review the copper CVD line, via fill properties, and CMP line resistance. With CVD, trenches and vias with high aspect ratio(above 3) can be filled completely. Sputtering-reflow technique, a new method to filling copper into lines, is also reviewed to compare the CVD process.

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