Journal of the Korean Data and Information Science Society
- 제5권2호
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- Pages.87-94
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- 1994
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- 1598-9402(pISSN)
Optimal Plan of Partially Accelerated Life Tests under Type I Censoring
초록
In this paper, we consider optimum plan to determine stress change times under the three-step stress PALTs, assuming that each test units follows an exponential distribution. The tampered random variable(TRV) model for the three-step stress PALTs setup are introduced, and maximum likelihood estimators(MLEs) of the failure rate and the acceleration factors are obtained. The change times to minimize the generalized asymptotic variance(GAVR) of MLEs of the failure rate and the acceleration factors are proposed for the three-step stress PALTs.
키워드