Applied Microscopy
- Volume 24 Issue 4
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- Pages.132-144
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- 1994
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- 2287-5123(pISSN)
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- 2287-4445(eISSN)
Analysis of Electronic Materials Using Transmission Electron Microscopy (TEM)
전자현미경을 이용한 전자재료분석
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Kim, Ki-Bum
(Dept. of Metallurgical Eng., Seoul National Univ.)
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김기범
(서울대학교 공과대학 금속공학과)
- Published : 1994.12.01
Abstract
The application of TEM in investigating the evolution of microstructure during solid phase crystallization of the amorphous Si,
Keywords