Journal of the Korean Society for Nondestructive Testing (비파괴검사학회지)
- Volume 14 Issue 3
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- Pages.157-171
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- 1994
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- 1225-7842(pISSN)
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- 2287-402X(eISSN)
Construction of UHV Scanning Tunneling Microscope
초고진공용 주사형 터널링 현미경의 제작
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Koo, Ja-Yong
(Korea Research Institute of Standards and Science) ;
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Kim, Dal-Hyun
(Korea Research Institute of Standards and Science) ;
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Park, Hae-Won
(Korea Research Institute of Standards and Science) ;
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Kim, Goo-Young
(Korea Research Institute of Standards and Science) ;
- Lee, Se-Kyung (Korea Research Institute of Standards and Science)
- Published : 1994.12.17
Abstract
A scanning tunneling microscope has been built, which can resolve atomic arrangements of conductors and semiconductors in ultra high vacuum below
진공도가
Keywords