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Direct Solid Sample Analysis in the Moderate Power He Mip with the Spark Generation

  • S. R. Koirtyohann (Department of Chemistry, University of Missouri) ;
  • Yong-Nam Pak (Department of Chemistry Education, Korea National University of Education)
  • 발행 : 1994.08.20

초록

Conducting solid samples are successfully analyzed with the spark ablation combined to the moderate power (500W) Helium Microwave Induced Plasma (He MIP). The relative standard deviations are in the range of 3-10% and the detection limits are around 50 ${\mu}$g $g^-1$. These values are higher than those of Ar MIP or Ar Inductively Coupled Plasma. Spark ablated particles are examined to investigate the analytical characteristics of the system.

키워드

참고문헌

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피인용 문헌

  1. Electroerosion of metal in aqueous solution for sample introduction into an inductively coupled plasma mass spectrometer vol.58, pp.7, 2003, https://doi.org/10.1016/s0584-8547(03)00070-3