In-line APCVD에 의해 제작된 $SnO_2(:F)$ film의 특성

Properties of fluorine-doped $SnO_2$ films perpared by the in-line APCVD system

  • Sei Woong Yoo (Technical Research Institute, Hankuk Glass Ind., Inc., Inchon 402-130, Korea) ;
  • Byung Seok Yu (Technical Research Institute, Hankuk Glass Ind., Inc., Inchon 402-130, Korea) ;
  • Jeong Hoon Lee (Technical Research Institute, Hankuk Glass Ind., Inc., Inchon 402-130, Korea)
  • 발행 : 1994.06.01

초록

APCVD에 의한 $SnO_2(:F)$ 박막 형성시 HF와 $H_2O$량의 변화에 따른 증착 조건이 전기적, 광학적 특성 그리고 textured $SnO_2(:F)$ 박막의 표면형상에 미치는 영향을 관찰하였다. HF의 bubbling량이 0.9 slm 이상일 경우에는 전자농도(electron concentration)가 $3{\Times}10^{20}/cm^3$에 도달 하였으며, 비저항값은 $7{\Times}10^4~9{\Times}10^4{Omega}cm$ 범위이었고, mobility 값은 $18~25 cm^{-2}/V.sec$이었다. 결정 grain의 형태는$H_2O$를 첨가시키지 않으며 증착시킨 경우 끝이 뾰족한 예각을 가진 pyramid 형태였으며, $H_2O$를 첨가시키며 증착시킨 경우에는 끝이 둥근 hemispherical 형이었다.

The surface morphology, electrical properties, and optical properties of textured $SnO_2(:F)$ films according to deposition parameters such as HF and $H_2O$ content was studies. The electron concentration, resistivity, and mobility was $3{\Times}10^{20}/cm^3$, $7{\Times}10^4~9{\Times}10^4{Omega}cm$ and $18~25cm^2/V.sec$, respectively, when HF bubbling rate over 0.9 slm. The surface morphology was sharp edged pyramid shape without bubbling $H_2O$ but changed to round edged hemispherical shape when $H_2O$ was added.

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