Journal of the Korean Crystal Growth and Crystal Technology (한국결정성장학회지)
- Volume 3 Issue 2
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- Pages.131-139
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- 1993
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- 1225-1429(pISSN)
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- 2234-5078(eISSN)
Observation of Defects in the Alpha-Alumina Single Crystal by TEM and REM Techniques
투과전자현미경(TEM)과 반사전자현미경법(REM)을 이용한 알루미나 단결정내의 결함들에 관한 관찰
- Kim, Yootaek (Department of Materials Engineering, Kyonggi University)
- 김유택 (경기대학교 재료공학과)
- Published : 1993.04.01
Abstract
Transmission electron microscopy( lEM) technique which is useful for investigating the crystalline structure and defects, and reflection electron microscopy( REM) of which technique has very high sensitivity of detecting the defects on the crystal surfaces were applied to study the behaviour of dislocations and twins in or on the
결정 구조와 결정 내부의 결함들을 연구하는데 매우 유용한 투과전자현미경법(TEM)과 결정 표면에 존재하는 결함들을 발견하는데 있어 매우 민감한 인지력이 있는 반사현미경법(REM)을 이용하여 알루미나(
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