분석과학 (Analytical Science and Technology)
- 제5권1호
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- Pages.121-126
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- 1992
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- 1225-0163(pISSN)
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- 2288-8985(eISSN)
투과전자현미경을 이용한 GaAs의 면결함 구조 연구
Transmission Electron Microscopy of GaAs Planar Defects
- Cho, N.H. (Materials Research Division Korea Institute of Science and Technology) ;
- Hong, Kug Sun (Materials Research Division Korea Institute of Science and Technology) ;
- Cater, C.B. (Dept. of Materials Science and Engineering, Cornell University)
- 투고 : 1992.03.15
- 발행 : 1992.03.25
초록
GaAs
Transmission electron microscopy was used to investigate the structure of GaAs