전자공학회논문지B (Journal of the Korean Institute of Telematics and Electronics B)
- 제29B권9호
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- Pages.1-7
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- 1992
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- 1016-135X(pISSN)
CMOS 테스트를 위한 Built-In Self-Test 회로설계
A Built-In Self-Test Method for CMOS Circuits
초록
This paper proposes a built-in self-test tchnique for CMOS circuits. To detect a stuck-open fault in CMOS circuits, two consequent test patterns is required. The ordered pairs of test patterns for stuck-open faults are generated by feedback shift registers of extended length. A nonlinear feedback shift register is designed by the merging method and reordering algorithms of test patterns proposed in this paper. And a new multifunctional BILBO (Built-In Logic Block Observer) is designed to perform both test pattern generation and signature analysis efficiently.
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