참고문헌
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- J Electrochem. Soc. v.112 no.896 Determination of the Density and Dielectric Constant of Thin Ta[sub 2]O[sub 5] Films J. Klerer
- IEEE Trans. Component Pts. v.PMP-1 no.S1 B.H. Vromen;K. Klerer
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J. Electrochem Soc.
v.132
no.3054
Effects of Surface Oxide on Leakage Current of Magnetron-Sputtered
$Ta_2O_5$ on Si S. Seki;T. Unagami;O. Kogune -
Selective Studies of Crystalline
$Ta_2O_5$ Films v.133 no.1405 S. Roberts;J. Ryan;L. Nesbit - Acta Met v.5 no.711 Anomalies in the Growth of Anodic Oxide Films on Rough Surfaces L. Young
- J Electrochem Soc. v.115 no.219 Information on Anodic Oxides on Valve Metals Oxide Growth at Constant Rate of Voltage Increase C.G. Dunn
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ibid
v.111
no.1167
The Determination of the Density of Ta, Nb and Anodically Formed
$Ta_2O_5$ and$Nb_2O_5$ A.J. Schrijner;A. Middelgoek - Thin Solid Films v.155 no.115 Anodic oxidation of Niobium on Aqueous Solution of Weak Organic Acids R.K. Nigam;K.C. Singh;S. Maker
- berhn Elektrolyt-Kondensatoren A. Guntherschulze;H. Betz;M. Krayn