평판형 반응성 이온 식각기의 설계변수 분석

Design Parameter Analysis for a Planar Type Reactive Ion Etcher

  • 강봉구 (포항공과대학 전기,전자공학과) ;
  • 박성호 (한국전자통신연구소 반도체기술연구단) ;
  • 전영진 (한국전자통신연구소 반도체기술연구단)
  • 발행 : 1989.11.01

초록

Reactor design considerations over several critical parameters for a planar type reactive ion etcher are given. The etch uniformity is taken as a principal design constraint. The characteristics of economicaly available vacuum pumping system are taken as practical design constraints. A set of theoretical conditions on the chamber geometry and on the gas delivery and vacuum system, that satisfy the design constraints, are derived from basic properties of RF glow discharge and gas dynamics. The theoretical results are applied to decide design parameters of a practical single-wafer-per-chamber planar type reactive ion etching machine.

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