A Design Approach to Concurrent Self-Diagnosable Microprocessor

동시자기진단이 적용한 마이크로푸로세서의 하드웨어 구성에 관한연구

In this paper, a design approch is presented for a concurrent self-diagnosable microprocessor. An efficient diagnostic procedure to dynamically test the processor functional units decomposed by each insturction, concurrently with a program under execution is suggested. The basic goals of the proposed design approach are the low hardware overhead, no increase in the pin count and the minimal change of the initial design concepts on conventional microprocessors. The results of the performance of the suggested self-diagnosing hardware for an 8080 type microprocessor show that the suggested diagnosis scheme would be efficiently applicable, since diagnosing the processor functional units can be completed in a reasonably short time with the execution of an arbitrarily chosen sample program.