A Study of Efficiency Improvement of the D-algorithm for NAND Circuits

NAND회로망의 시험패턴발생을 위한 D-알고리듬의 효율개선에 관한 연구

In this paper, it is tried to improve efficiency of the D-algorithm by assigning the logic values effectively on the nodes related to the critical path for back tracing to reduce the number of search nodes when acyclic combinational logic circuits are composed of NAND gates only. For that purpose, LASAR algorithm which is suitable for determining a critical path for back tracing is applied to the D-algorithm and it is implemented by IBM-PC with APL language. The test results on a number of NAND circuits which have multi-fanout, reconvergent and symetric characteristics show that the modified D-algorihtm reduces the number of search nodes in forward and backward tracing and decreases the run time of CPU about 10 percents.