The Journal of Korean Academy of Prosthodontics (대한치과보철학회지)

The Korean Academy of Prosthodonitics (대한치과보철학회)
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SCANNING ELECTRON MICROSCOPIC STUDY ON THE TAG LENGTH OF RESIN IN THE ETCHED ENAMEL CEMENTED WITH THE COMPOSITE RESIN CEMENT

탈회된 법랑질과 복합레진계 시멘트의 접착시 레진돌기 길이에 관한 주사현미경적 연구

  • Park, Chang-Keun (Department of Prosthodontics, College of Dentistry, Seoul National University) ;
  • Chang, Wan-Shik (Department of Prosthodontics, College of Dentistry, Seoul National University) ;
  • Yang, Jae-Ho (Department of Prosthodontics, College of Dentistry, Seoul National University) ;
  • Lee, Sun-Hyung (Department of Prosthodontics, College of Dentistry, Seoul National University)
  • 박창근 (서울대학교 치과대학 보철학교실) ;
  • 장완식 (서울대학교 치과대학 보철학교실) ;
  • 양재호 (서울대학교 치과대학 보철학교실) ;
  • 이선형 (서울대학교 치과대학 보철학교실)
  • Published : 1987.12.01
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Abstract

The purpose of this study was to compare the resin tag length of 3 composite resin cements: Panavia, Compspan, Conclude, and the resin tag length of Panavia cemented to daliva-contaminated enamel using scanning electron microscopy. The following conclusions can be drawn from this study. 1. The resin tag length of panavia was $8.29{\mu}m$, compsan $8.72{\mu}m$, conclude $7.74{\mu}m$, and Panavia cemented to saliva-contaminated enamel $3.92{\mu}m$. 2. No significant difference of resin tag length between Panavia, Comspan and Conclude could be observed. 3. Saliva contamination of etched enamel surface decreases the wettability of composite resin cement.

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