Process Capability Analysis by the Experiment of Chips

Chips 실험에 의한 공정능력의 해석

  • 송서일 (동아대학교 산업공학과) ;
  • 황의철 (한양대학교 산업공학과)
  • Published : 1987.12.01

Abstract

Process capability is reflected on four major factors such as materials, equipments. skill of operators, and methods. The status of the process is typically represented by the mean value 〔$\mu$〕as a central tendancy, and the variance 〔$\sigma$$^2$〕 as a magnitude of dispersion. This paper analyzes the process capability by the experiment of chips is accounted on a population from the process. So, this paper analyzes the next four cases : (1) When the process distribution is changed from N[$\mu$$_1$, $\sigma$$^2$〕to N〔$\mu$$_2$, $\sigma$$^2$〕. (2) When the process distribution is changed from N[$\mu$, $\sigma$$_1$$^2$] to N[$\mu$, $\sigma$$_2$$^2$]. (3) When the population is compounded by the different two distributions of N〔$\mu$$_1$, $\sigma$$^2$〕and N〔$\mu$$_2$, $\sigma$$^2$〕. (4) When the population is compounded by the different two distributions of N〔$\mu$, $\sigma$$_1$$^2$〕 and N[$\mu$$\sigma$$_2$$^2$].

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