References
- 薄膜ハンドブッグ 日本學術振與會薄膜 第 131 秀員會(編)
- Hand-book of Thin Film Technology L.I. Maissel(ed.);R. Glang(ed.)
- Electrical Conduction in Thin Metal Films T.J. Coutts
- J. Phys. Chem. Solids v.37 Activation Energy for Electrotransport in Thin Aluminum Films by Resistance Measurements R.E. Hummel;R.T. Dehoff;H.J. Geier
- J. Appl. Phys. v.40 Electromigration in Thin Al Films I.A. Blech;E.S. Meieran
- J. Appl. Phys. v.39 Intrinsic Resistivity and Electron Mean Free Path in Aluminum Films A.F. Mayadas
- 茨城大學工學部 硏究集報 金屬蒸着膜の酸化と 電氣抵抗の變化 竹內學;金子當士男;長地秀雄
- Thin Solid Films v.337-344 Electron-Stimulated Desorption Study of Hydrogen-Exposed Aluminum Films G.H. Park;M. Bujor;H. Poppa
- Proc. 7th Intern .Vac. Congr & 3rd intern. Conf. Solid Surfaces Influence of the Film-Substrate System Charge State on Electrical Conductivity of Al Thin Films V.M. Koleshko
- PNL-3573 UC-62 Barstow Heliostat Mirror Glass Characterization M.A. Lind;C.Q. Buckwalter
- Books for Industry Corrosion of Glass D.E. Clark;C.G. Panthano. Jr.;L.L. Hinch
- Glass Science R.H. Doremus
- Surf Sci. v.30 Room Temperature of Water by Aluminum Thin Films W.H. Kreuger
- J. Vac. Sci. Technol v.20 A Study of the Initial Oxidation of Evaporated Thin Films of Aluminim by AES, ELS and ESD M. Bujor;L.A. Larson;H. Poppa
- J. Materials Sci. v.19 Review Adhesion and Durability of Metal-Polymer Bonds J.D. Venables
- Size Effects in Thin Films C.R. Tellier;A.J. Tosser
- Thin Solid Films v.97 The Influence of Some Evaporation Parameters on the Structure and Properties of Thin Aluminum Films J.E. Curran;J.S. Page;U. Pick
- J. Appl. Phys. v.45 Oxide Structure in Evaporated Aluminum Films R.B. Pettit
- Surf. Sci. v.86 Interatomic Auger Transition Spectroscopy as a Probe for the Study of O₂and CO Adsorption on Al Y. Katayama;K. L. I. Kobayashi;Y. Shiraki