The Transactions of the Korean Institute of Electrical Engineers (대한전기학회논문지)
- Volume 36 Issue 10
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- Pages.719-723
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- 1987
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- 0254-4172(pISSN)
Desgin Method of the Quartz Crystal Thickness Monitor and its Characteristics
수정 진동자를 이용한 박막두께 감시 장치의 제작과 특성
Abstract
This paper shows the design method and the experimental results of the thin film thickeness monitor. The thin film thickness monitor uses 6 MHz quartz crystal in sensor and cooling system for the fine operation. The thin film thickness are measured by the digital frequrency counter.
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