Journal of the Korean Institute of Telematics and Electronics (대한전자공학회논문지)

The Institute of Electronics and Information Engineers (대한전자공학회)
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A Test Algorithm for Data Processing Function of MC68000 ${\mu}$ P

MC68000 ${\mu}$ P의 데이터 처리기능에 관한 시험 알고리즘

  • Kim, Jong Hoon (Dept. of Comp. Eng., Dong A Univ.) ;
  • Ahn, Gwang Seon (Dept. of Elec. Eng., Kyungpook National Univ.)
  • 김종훈 (동아대학교 전산공학과) ;
  • 안광선 (경북대학교 전자공학과)
  • Published : 1986.02.01
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Abstract

In this paper, we present an efficient test algorithm for data processing function of MC68000 \ulcorner. The test vector for functional testing is determined by stuck-at, coupling and transition fault for data storage and transfer. But for data manipulation it is determined by a boolean function of micro-operation. This test algorithm is composed of 3 parts, choosing optimum test instructions for maximizing fault coverage and minimizing test process time, deciding the test order for minimizing test ambiguity, and processing the actual test.

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