Direct Observations of Al-Si Junction Interface

Al-Si 접합부의 직접관찰

  • Lee Ki-Seon (The Korea Atomic Energy Research Institute)
  • Published : 1978.04.01

Abstract

Al-Si junctions were made by vacuum deposition of aluminium on to silicon wafers and examined by TEM. The uneven interfaces of the junctions are formed due to the surface tension of the molten solution resulting in preferential dissolution of silicon in aluminium at some areas. These undesirable uneven interfaces affect the junction shape and so the over-all characteristics of the devices.

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