A Study on Fault Detection Tests for Combintional Logic Networks

조합논리회로의 결함검출시험에 관한 연구

This paper proposes a simple and systematic method for the generation of the fault detection test sets for the combinational logic networks. Based on tile path sensitizing concept, the test patterns for the primary input gates of the network are defined, and then it is shown that, arranging these predefined test patterns according to the path sensitizing characteristics of the given network sturctures, the minimal complete test sets for the fan-out free combinational networks can be found easily. It is also shown that, taking into account the fan-out paths sensitizing compatibility, the proposed method can be extended to the irredundant reconvergent fan-out networks.