Electric Resistance of Gold Thin Film

금박막의 전기저항특성

The resistances of gold thin film are measured as a function of thickness and temperature(300$^{\circ}$k~420$^{\circ}$k). In this paper, the experimental results are analysed using the theory which had been proposed by Sondheimer and Neugebauer and it is shown that the temperature coefficient of resistance of gold thin film become meatily zero at the value of thickness of about 45$\AA$ and its critical thickness is about 60$\AA$.

금박막의 저항을 두께와 온도(300。∼420。k)의 함수로써 측정하였다. 본논문에서는 상기의 측정결과를 Sondheimer와 Neugebauer가 제시한 이론에 따라 해석하였으며 금박막의 두께가 약 45Å일때 저항온도계수가 영이 되며 그 임계두께가 약 60Å됨을 밝혔다.