Theoretical Investigations and measuring Techniques of Geometrical Factor influencing Sensitive Electronic Devices

감도전자장치에 영향을 주는 기하학적 인수의 이론적 연구와 측정

In the designs of the sensitive electronic devices such as phase sensitive detector, X-ray diffractometer, and neutron diffractometers, we must take into account the geometrical factors in a coil systems and extraneous stray fields. Input wave forms in such a sensitive electronic devices are often altered by the influence of these factors. Since the magnitude of the stray fields is generally very small, this affection may be removed by applying a good shielding but it is not ease to remove the affection from a geometrical factor. This affection must be however calculated by the theoretical methods and analytical solution in the equation of these factors. The fundamental purpose of this paper lie in the theoretical calculations and practical measurements of the geometrical factor in the coil systems, finite solenoid, and four point prove. In the heoretical calculations, the geometrical factors in the coil systems were calculated by applying the elliptic functions and in the contact points were calculated by applying the elliptic functions and in the contact points were calculated by applying the eigen functions and the infinite series. The measurements were carried out by using the sensitive electronic device made from author's design, as shown in the Fig. 9. The result of this work has verified the essential correctness of theoretical investigations and measuring techniques of geometrical factors on the design of sensitive electronic devices. It also has several advantages such that: (1) all the data obtained may give effective data to designer to work on the field of sensitive electronic devices or microelectronic devices, (2) it has evidently explained the characteristics of electrical investigations and physical definition, and has removed the conventional error of geometrical factors in the coil systems and contact points.