A Study on Outlier Detection in Smart Manufacturing Applications

Smart manufacturing is a process of integrating computer-related technologies in production and by doing so, achieving more efficient production management. The recent development of supercomputers has led to the broad utilization of artificial intelligence (AI) and machine learning techniques useful in predicting specific patterns. Despite the usefulness of AI and machine learning techniques in smart manufacturing processes, there are many fundamental issues with the direct deployment of these technologies related to data management. In this paper, we focus on solving the outlier detection issue in smart manufacturing applications. More specifically, we apply a state-of-the-art outlier detection technique, called Elliptic Envelope, to detect anomalies in simulation-based collected data.