Perpendicular magnetic anisotropy induced by spin direction of antiferromagnet layers in a ferromagnetic-antiferromagnetic bi-layer system

Kim, Wondong (Center for Nanometrology, Division of Industrial Metrology, Korea Research Institute of Standards and Science) ;
Yang, Gwang-Eun (Center for Nanometrology, Division of Industrial Metrology, Korea Research Institute of Standards and Science) ;
Moon, Kyoung-Woog (Center for Nanometrology, Division of Industrial Metrology, Korea Research Institute of Standards and Science) ;
Chun, Byung Sun (Center for Nanometrology, Division of Industrial Metrology, Korea Research Institute of Standards and Science) ;
Hwang, Chanyong (Center for Nanometrology, Division of Industrial Metrology, Korea Research Institute of Standards and Science) ;
Lee, Han-Ku (Industrial Technology Convergence Center, Pohang Light Source II, Pohang Accelarator Laboratory) ;
Kim, Jae-Young (Industrial Technology Convergence Center, Pohang Light Source II, Pohang Accelarator Laboratory)