적층 공정에서의 상태 기반 모니터링

Condition Monitoring in Multilayer Stacking Processes

In the process of MLCC manufacturing, MLCC stacking process is the key process of making high quality MLCC. Since MLCC is small components, the entire process of MLCC stacking process is minute and sensitive to micro errors. To prevent micro error, we suggest condition-based monitoring which quantifies error based on feature extraction and quantifying error method. As results, it has been shown that the suggested algorithm has effectiveness of condition based monitoring of MLCC stacker.