Electrical Properties of Local Bottom-Gated MoS2 Thin-Film Transistor

  • Kwon, Junyeon (Department of Electronics and Radio Engineering, Kyung Hee University) ;
  • Lee, Youngbok (Department of Electronics and Radio Engineering, Kyung Hee University) ;
  • Song, Wongeun (Department of Electronics and Radio Engineering, Kyung Hee University) ;
  • Kim, Sunkook (Department of Electronics and Radio Engineering, Kyung Hee University)
  • Published : 2014.02.10

Abstract

Layered semiconductor materials can be a promising candidate for large-area thin film transistors (TFTs) due to their relatively high mobility, low-power switching, mechanically flexibility, optically transparency, and amenability to a low-cost, large-area growth technique like thermal chemical vapor deposition (CVD). Unlike 2D graphene, series of transition metal dichalcogenides (TMDCs), $MX_2$ (M=Ta, Mo, W, X=S, Se, Te), have a finite bandgap (1~2 eV), which makes them highly attractive for electronics switching devices. Recently, 2D $MoS_2$ materials can be expected as next generation high-mobility thin-film transistors for OLED and LCD backplane. In this paper, we investigate in detail the electrical characteristics of 2D layered $MoS_2$ local bottom-gated transistor with the same device structure of the conventional thin film transistor, and expect the feasibility of display application.

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