Oxidative Line Width Reduction of Imprinted Nanopatterns

  • Park, Dae Keun (Department of Chemistry, Sungkyunkwan University (SKKU)) ;
  • Kang, Aeyeon (Department of Chemistry, Sungkyunkwan University (SKKU)) ;
  • Jeong, Mira (Korea Institute of Machinery and Materials (KIMM)) ;
  • Lee, Jaejong (Korea Institute of Machinery and Materials (KIMM)) ;
  • Yun, Wan Soo (Department of Chemistry, Sungkyunkwan University (SKKU))
  • Published : 2013.02.18

Abstract

Although imprinted nanopatterns of organic polymer can be modified by the heat treatment [1], it generally requires high process temperatures and is material-dependent since the heat-induced mass loss of the organic polymer is greatly affected by its chemical characteristics. When oxygen is added during the annealing process, one can reduce the process temperature as well as the dependence of the materials. With the oxygen, line width reduction of a polymer (SU-8) patterns could be accomplished at temperature of as low as $250^{\circ}C$ which was not possible in the heat only process. This oxidative line width reduction can be dramatically promoted with the introduction of oxygen plasma. The oxygen plasma, with its highly-reactive oxygen species, vigorously etches away the organic materials, proven to be extremely effective line with reduction method. It is, however, very hard to control the extent and homogeneity of the etching, particularly of very fine patterns. Here, we report an effective and reliable line width reduction method of imprinted nanopatterns by combined plasma and heat treatment. The merits of this process include the reduction of process temperature, time and material-dependence.

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