EDISON SW 활용 경진대회 논문집 (Proceeding of EDISON Challenge)
- 제2회(2013년)
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- Pages.252-255
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- 2013
Simulation of nano MOS gate tunneling current with SiO2/Er2O3 double-layer gate dielectrics
- Hong, Seok Man (School of Electrical Engineering, Korea University) ;
- Ha, Hyeon Jun (School of Electrical Engineering, Korea University) ;
- Moon, Young Sun (School of Electrical Engineering, Korea University)
- 발행 : 2013.04.17