Proceedings of the Korean Society of Broadcast Engineers Conference (한국방송∙미디어공학회:학술대회논문집)

The Korean Institute of Broadcast and Media Engineers (한국방송∙미디어공학회)
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Patch-wise Robust Active Shape Model using Point Reliance Measurement

  • Hong, Sungmin (School of EECS, Seoul National University) ;
  • Park, Sanghyun (School of EECS, Seoul National University) ;
  • Yun, Il Dong (Dept. of Digital Information Engineering, Hanguk University of Foreign Studies) ;
  • Lee, Sang Uk (School of EECS, Seoul National University)
  • Published : 2012.07.05
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Abstract

The active shape model(ASM) is one of the most popular methods among the shape prior based segmentation methods based on its strong shape constraints using the statistic of shape information which is acquired from the training set. ASM has a few drawbacks, such as, the lack of shape variability, and the sensitivity for false locally searched points. In this paper, we suggest the patch-wise robust ASM to overcome the limitations of the ASM. In addition to the SSM, we introduce the patch-wise SSM, to reduce the shape inflexibility and to search reliable points with the point reliance measurement. The quantitative and qualitative results show the robustmness and the accuracy of the proposed method.

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