Proceedings of the KIEE Conference (대한전기학회:학술대회논문집)
- 2011.07a
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- Pages.1654-1655
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- 2011
Conversion Algorithm for measuring Scattering Parameters of Multiport System with a 2-port Network Analyzer
2포트 회로망 분석기를 이용한 다중포트 시스템의 S파라미터 측정에 관한 컨버전 알고리즘
- Long, Luong Duc (Sungkyunkwan University) ;
- Lee, June-Sang (Sungkyunkwan University) ;
- Bae, Hyeon-Ju (Sungkyunkwan University) ;
- Lee, Jae-Joong (Sungkyunkwan University) ;
- Nah, Wan-Soo (Sungkyunkwan University)
- Published : 2011.07.20
Abstract
This paper presents an algorithm applied to measure scattering parameters of a Multiport device with a 2-port Vector Network Analyzer (VNA). By employing the conversion of Scattering matrix with different reference impedances at ports, data obtained from 2-port configuration measurements can be synthesized to build the full scattering matrix of this device. A good agreement of estimated and measured parameters verified the performance of the algorithm.
Keywords