Detection of Gate-controlled Rashba Effect Using Potentiometric Measurement

  • Park, Youn-Ho (Spin device Research Center, Korea Institute of Science and Technology) ;
  • Jang, Hyun-Cheol (Spin device Research Center, Korea Institute of Science and Technology) ;
  • Koo, Hyun-Cheol (Spin device Research Center, Korea Institute of Science and Technology) ;
  • Kim, Hyung-Jun (Spin device Research Center, Korea Institute of Science and Technology) ;
  • Chang, Joon-Yeon (Spin device Research Center, Korea Institute of Science and Technology) ;
  • Choi, Heon-Jin (Department of Materials science and Engineering, Yonsei University) ;
  • Han, Suk-Hee (Spin device Research Center, Korea Institute of Science and Technology) ;
  • Kim, Hi-Jung (Spin device Research Center, Korea Institute of Science and Technology)
  • Published : 2011.06.09