A Study on Fault Detection Scheme on TMRed Circuits

삼중화된 회로에서의 결함 감지를 위한 방법에 관한 연구

  • Kang, Dong-Soo (Dept. of Computer Engineering ChungNam National University) ;
  • Lee, Jong-Kil (Dept. of Computer Engineering ChungNam National University) ;
  • Jhang, Kyoung-Son (Dept. of Computer Engineering ChungNam National University)
  • 강동수 (충남대학교 컴퓨터 공학과) ;
  • 이종길 (충남대학교 컴퓨터 공학과) ;
  • 장경선 (충남대학교 컴퓨터 공학과)
  • Published : 2011.06.29

Abstract

SRAM-based FPGAs are very sensitive to single event upset(SEU) induced by space irradiation. To mitigate SEU effects, space applications employ some mitigation schemes. The triple modular redundancy(TMR) is a well-known mitigation scheme. It uses one or three voters as well as three identical blocks performing the same work. The voters can mask out one error in the outputs from the three replicated blocks. One SEU error in TMRed circuits can be masked but it needs to be detected for some reasons such as to analyze the SEU effects in the satellite or to recover the circuits from the error before additional error occur. In this paper, we developed a fault detection circuit and reporting system to detect a fault on the TMRed circuits. To verify our error detection circuit and reporting circuit, we performed an irradiation test at MC-50 Cyclotron. Experimental results showed that error detection circuit can detect a fault on the TMRed test circuit in radiation environment.

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Acknowledgement

Supported by : National Research Foundation of Korea(NRF)