Proceedings of the Korean Institute of Information and Commucation Sciences Conference (한국정보통신학회:학술대회논문집)
- 2011.10a
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- Pages.882-885
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- 2011
Testing and Self Calibration of RF Circuit using MEMS Switches
- Kannan, Sukeshwar (Department of Electrical and Computer Engineering University of Alabama) ;
- Kim, Bruce (Department of Electrical and Computer Engineering University of Alabama) ;
- Noh, Seok-Ho (Andong National University) ;
- Park, Se-Hyun (Andong National University)
- Published : 2011.10.26
Abstract
This paper presents testing and self-calibration of RF circuits using MEMS switches to identify process-related defects and out of specification circuits. We have developed a novel multi-tone dither test technique where the test stimulus is generated by modulating the RF carrier signal with a multi-tone signal generated using an Arbitrary Waveform Generator (AWG) with additive white Gaussian noise. This test stimulus is provided as input to the RF circuit and peak-to-average ratio (PAR) is measured at the output. For a faulty circuit, a significant difference is observed in the value of PAR as compared to a fault-free circuit. Simulation is performed for various circuit conditions such as fault-free as well as fault-induced and their corresponding PARs are stored in the look-up table. This testing and self-calibration technique is exhaustive and efficient for present-day communication systems.
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