Critical Phenomena of Roughness with Respect to External Magnetic Field in Ultrathin Ferromagnetic Film

  • Lee, Kang-Soo (Center for Subwavelength Optics and School of Physics and Astronomy, Seoul National University) ;
  • Lee, Chang-Won (Samsung Advanced Institute of Technology) ;
  • Cho, Young-Jin (Samsung Advanced Institute of Technology) ;
  • Seo, Sun-Ae (Samsung Advanced Institute of Technology) ;
  • Choe, Sug-Bong (Center for Subwavelength Optics and School of Physics and Astronomy, Seoul National University)
  • Published : 2009.12.06