Cu diffusion behavior in SiOC(-H) films with annealed Cu/SiOC(-H)/p-Si(100)/Al metal-insulator-semiconductor(MIS) structures

  • Choi, Chi-Kyu (Nano Thin Film Materials Laboratory, Department of Physics, Cheju National University) ;
  • Lee, Heang-Seuk (Nano Thin Film Materials Laboratory, Department of Physics, Cheju National University) ;
  • Woo, Jong-Kwan (Nano Thin Film Materials Laboratory, Department of Physics, Cheju National University) ;
  • Kim, Chang-Young (Nano Thin Film Materials Laboratory, Department of Physics, Cheju National University)
  • 발행 : 2009.08.19