Proceedings of the Korean Vacuum Society Conference (한국진공학회:학술대회논문집)
- 2009.08a
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- Pages.172-172
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- 2009
Amorphous indium gallium zinc oxide thin film optical characteristic using ellipsometery
- Yoo, Hee-Jun (School of information and Communication engineering, Sungkyunkwan University) ;
- Jeong, S.W. (School of information and Communication engineering, Sungkyunkwan University) ;
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Roh, Yong-Han
(School of information and Communication engineering, Sungkyunkwan University)
- Published : 2009.08.19
Abstract
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