한국진공학회:학술대회논문집 (Proceedings of the Korean Vacuum Society Conference)
- 한국진공학회 2009년도 제37회 하계학술대회 초록집
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- Pages.147-147
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- 2009
NBTI/PBTI analysis of the memory characteristics improved by hydrogen annealing in MANOS capacitors
- Kim, H.D. (Dept. of Electronics Eng., Korea Univ.) ;
- An, H.M. (Dept. of Electronics Eng., Korea Univ.) ;
- Seo, Y.J. (Dept. of Electronics Eng., Korea Univ.) ;
- Zhang, Y. (Dept. of Electronics Eng., Korea Univ.) ;
- Kim, K.C. (Dept. of Electronics Eng., Korea Univ.) ;
- Nam, K.H. (Dept. of Electronic Materials Engineering, Kwangwoon Univ.) ;
- Chung, H.B. (Dept. of Electronic Materials Engineering, Kwangwoon Univ.) ;
- Kim, T.G. (Dept. of Electronics Eng., Korea Univ.)
- 발행 : 2009.08.19