Dependence of Device Characteristics of Graphene upon Fabrication Process

  • Kim, Kang-Hyun (Korea Research Institute of Standards and Science (KRISS)) ;
  • Kang, Hae-Yong (Korea Research Institute of Standards and Science (KRISS)) ;
  • Woo, Byung-Chill (Korea Research Institute of Standards and Science (KRISS)) ;
  • Yun, Wan-Soo (Korea Research Institute of Standards and Science (KRISS))
  • Published : 2009.08.19