Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference (한국전기전자재료학회:학술대회논문집)
- 2009.05a
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- Pages.7-8
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- 2009
Non-contact critical current measurement using hall probe
Hall probe를 이용한 비접촉 임계전류 측정
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Kim, Ho-Sup
(Korea Electrotechnology Research Institute) ;
- Lee, Nam-Jin (KAIST) ;
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Ha, Dong-Woo
(Korea Electrotechnology Research Institute) ;
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Baik, Seung-Kyu
(Korea Electrotechnology Research Institute) ;
- Kim, Tae-Hyung (Korea Electrotechnology Research Institute) ;
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Ko, Rock-Kil
(Korea Electrotechnology Research Institute) ;
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Ha, Hong-Soo
(Korea Electrotechnology Research Institute) ;
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Oh, Sang-Soo
(Korea Electrotechnology Research Institute)
-
김호섭
(한국전기연구원) ;
- 이남진 (한국과학기술원) ;
-
하동우
(한국전기연구원) ;
-
백승규
(한국전기연구원) ;
- 김태형 (한국전기연구원) ;
-
고락길
(한국전기연구원) ;
-
하홍수
(한국전기연구원) ;
-
오상수
(한국전기연구원)
- Published : 2009.05.15
Abstract
Non-contact critical current measurement apparatus was developed using hall probe which measures the magnetic field distribution across the width of superconducting tape. The hall probe consists of 7 independent hall sensors which lie in a line 600