Proceedings of the Materials Research Society of Korea Conference (한국재료학회:학술대회논문집)

Materials Research Society of Korea (한국재료학회)
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Growth and Characterization of Vertically Aligned ZnO nanowires with different Surface morphology

  • Das, S.N. (Information and Electronic Materials Research Laboratory, Department of Material Science and Engineering, Yonsei University) ;
  • Choi, J.H. (Information and Electronic Materials Research Laboratory, Department of Material Science and Engineering, Yonsei University) ;
  • Kar, J.P. (Information and Electronic Materials Research Laboratory, Department of Material Science and Engineering, Yonsei University) ;
  • Myoung, J.M. (Information and Electronic Materials Research Laboratory, Department of Material Science and Engineering, Yonsei University)
  • Published : 2009.05.21
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Abstract

Vertically aligned zinc oxide (ZnO) nanorods (NRs) with different surface morphology were grown by metal organic chemical vapor deposition (MOCVD) on sapphire substrate. The films thus prepared were characterized by measuring X-ray diffraction (XRD), Scanning electron microscopy (SEM) and Transmission electron microscopy (TEM) studies. To study the effect of surface morphology on wettability, the contact angle (CA) of water was measured. It was demonstrated that the CA of the deposited ZnO NRs varied between $104^{\circ}$ and $135^{\circ}$ depending upon the surface morphology. Variable temperature photoluminescence (PL) have employed to probe the exciton recombination in high density and vertically aligned ZnO Nanorod arrays. The low-temperature PL characterizes the dominant near-band-edge excitonic emissions from such nanorod arrays.

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