한국정보디스플레이학회:학술대회논문집
- 2009.10a
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- Pages.1061-1064
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- 2009
Ohmic Contact for Hole Injection Probed by Dark Injection Space-Charge-Limited Current Measurements
- Song, Ok-Keun (OLED R&D Center, Samsung Mobile Display Co. LTD) ;
- Koo, Young-Mo (OLED R&D Center, Samsung Mobile Display Co. LTD)
- Published : 2009.10.12
Abstract
Through dark injection space-charge-limited current (DI-SCLC) and trap-free SCLC measurements, it has been demonstrated that an indium tin oxide (ITO)/buckminsterfullerene (