한국정보디스플레이학회:학술대회논문집
- 2009.10a
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- Pages.560-562
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- 2009
Reduction of Leakage current Generated by Degradation in Organic Thin Film Transistors using Pattern on Pentacene Surface by Atomic Force Microscope
- Hwang, Hyun-Doo (Dept. of Electronics and Computer Engineering, Hanyang University) ;
- Kim, Hyun-Suck (Dept. of Electronics and Computer Engineering, Hanyang University) ;
- Kim, Chang-Ho (Research Institute of Information Display, Hanyang University) ;
- Kim, Jae-Hoon (Dept. of Electronics and Computer Engineering, Hanyang University)
- Published : 2009.10.12
Abstract
In this paper, we proposed a simple method of decreasing the off current generated by degradation for improve the electrical characteristics such as mobility and on/off current ratio by making the line patterns on the pentacene surface between the electrodes using atomic force microscope (AFM) lithography.