Proceedings of the KIEE Conference (대한전기학회:학술대회논문집)

The Korean Institute of Electrical Engineers (대한전기학회)
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Analysis of Interference on the Signal over the Multiple TX-Lines of a Trace Layer in an IED

IED내 Trace층 다중 전송선로상의 신호간섭 특성 분석

  • Jang, Gun-Ho (Dept. of Info. & Telecomm. Eng., Universiy of Inchoen) ;
  • Kahng, Sung-Tek (Dept. of Info. & Telecomm. Eng., Universiy of Inchoen) ;
  • Baek, Hyun (School of Computer Sci. & Elec. Eng., Chung-ang University) ;
  • Kim, Hyeong-Seok (School of Computer Sci. & Elec. Eng., Chung-ang University)
  • 장건호 (인천대학교 정보통신공학과) ;
  • 강승택 (인천대학교 정보통신공학과) ;
  • 백현 (중앙대학교 전기전자공학부) ;
  • 김형석 (중앙대학교 전기전자공학부)
  • Published : 2009.07.14
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Abstract

In this article, we deal with the IED(Intelligent Electronic Device) on the EMC aspect. Recognizing how expensive the thorough EMC work will be regarding the entire IED, we focus on the characteristics of RF signals moving along multiple TX-lines in one specified example of the typical IED structure, say, the layer of trace lines. Simplifying the real structure, we run a 3D EM program and analyze the properties of signals on the lines and interference due to the coupling between the neighboring lines.

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