대한전자공학회:학술대회논문집 (Proceedings of the IEEK Conference)
- 대한전자공학회 2008년도 하계종합학술대회
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- Pages.773-774
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- 2008
Embedded System의 효율적 TEST 방법에 대한 연구
A Study on Efficient Test Method of Embedded System
- Kim, Seong-Gun (School of Electronics Engineering Ajou University) ;
- Chung, Ki-Hyun (School of Electronics Engineering Ajou University)
- 발행 : 2008.06.18
초록
As an Embedded system get more complicated, the importance of the software test increases. Especially it is mandatory to test the embeded software for a charge degrade of the development company which is happened due to the error, a danger element clearance to the customer, a performance enhance of the system. In this paper, we propose efficient test method which discovers the bug an embedded system using suitable test case selection and automation test.
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