Proceedings of the IEEK Conference (대한전자공학회:학술대회논문집)

The Institute of Electronics and Information Engineers (대한전자공학회)
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A dielectric constant measurement method of unprepared samples

비가공 물질의 유전율 측정 방법

  • Lee, Won-Hui (Department of Electronic and Electrical Engineering Pohang University of Science and Technology(POSTECH)) ;
  • Park, Wee-Sang (Department of Electronic and Electrical Engineering Pohang University of Science and Technology(POSTECH))
  • 이원희 (포항공과대학교 전자전기공학과) ;
  • 박위상 (포항공과대학교 전자전기공학과)
  • Published : 2008.06.18
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Abstract

A measurement method of the dielectric constant of materials whose standard sample is not prepared easily is proposed. The unprepared sample of the material is placed in a cavity, and the resonant frequency is measured. A commercial software simulates the same sample and the cavity leading to find the correct dielectric constant. The measured samples include a ceramic, a forced glass, and a powdered enamel.

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