Structural and electrical characterization of $CeO_2/HfO_2$ as a gate dielectric deposited by r.f magnetron sputter

  • Kang, In-Gu (School of Information and Communication Engineering, Sungkunkwan University) ;
  • Roh, Yong-Ha (School of Information and Communication Engineering, Sungkunkwan University)
  • Published : 2008.08.20