Proceedings of the Korean Vacuum Society Conference (한국진공학회:학술대회논문집)
- 2008.08a
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- Pages.114-114
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- 2008
Structural and electrical characterization of $CeO_2/HfO_2$ as a gate dielectric deposited by r.f magnetron sputter
- Kang, In-Gu (School of Information and Communication Engineering, Sungkunkwan University) ;
- Roh, Yong-Ha (School of Information and Communication Engineering, Sungkunkwan University)
- Published : 2008.08.20
Abstract
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