Infrared spectroscopy of nanometer-thick interface charge in ZnO field-effect transistor(FET)

  • Kim, Joo-Yun (Department of Physics, University of Seoul) ;
  • Jung, Sung-Hoon (Department of Physics, University of Seoul) ;
  • Kim, Ki-Tea (Institute of Physics and Applied Physics, Yonsei University) ;
  • Lee, Ki-Moon (Institute of Physics and Applied Physics, Yonsei University) ;
  • Im, Seong-Il (Institute of Physics and Applied Physics, Yonsei University) ;
  • Choi, E.J. (Department of Physics, University of Seoul)
  • Published : 2008.08.20