Effect of SiN$_x$ Capped Layer on the Microstructure and Magnetic Properties of CoPt/Ag Thin Films

• Ou, S.L. (Institute of Materials Science and Engineering, National Taiwan University) ;
• Kuo, P.C. (Institute of Materials Science and Engineering, National Taiwan University) ;
• Lin, P.L. (Institute of Materials Science and Engineering, National Taiwan University) ;
• Fang, Y.H. (Institute of Materials Science and Engineering, National Taiwan University) ;
• Lin, G.P. (Institute of Materials Science and Engineering, National Taiwan University) ;
• Chen, S.C. (Department of Materials Engineering, MingChi University of Technology)

• Published : 2008.12.10

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