Transport Properties of Magnetic Tunnel Junctions Comprising NiFeSiB/CoFeB Hybrid Free Layers

  • Cho, Ji-Ung (Department of Materials Science and Engineering, Korea University) ;
  • Kim, Do-Kyun (Department of Materials Science and Engineering, Korea University) ;
  • Wang, Tian Xian (Department of Materials Science and Engineering, Korea University) ;
  • Isogami, Shinji (Department of Electronic Engineering, Tohoku University) ;
  • Tsunoda, Masakiyo (Department of Electronic Engineering, Tohoku University) ;
  • Takahashi, Migaku (Department of Electronic Engineering, Tohoku University) ;
  • Kim, Young-Keun (Department of Materials Science and Engineering, Korea University)
  • Published : 2008.12.10